Facilities
Microscopy
- FEI Quanta 3D FEG Environmental Scanning Electron Microscope and Focused Ion Beam
- Hitachi HD-2300A Scanning Transmission Electron Microscope
- Hitachi S-4800 UHR Scanning Electron Microscope
- Keyence VHX-600 Digital Microscope
Thermal Analysis
- TA Instruments Q50 Thermogravimetric Analyzer (TGA)
- TA Instruments Q800 Dynamic Mechanical Analyzer (DMA)
- TA Instruments DSC 250
sPECTROSCOPY
- PerkinElmer FTIR/NIR Frontier Spectrometer coupled with Spotlight imaging system with array detector
- Varian Excalibur Series Fourier Transform Infrared (FTIR) instruments, the FTS-4000 Spectrometer and the UMA-600 Microscope
- Jobin Yvon Horiba Confocal Raman Spectrometer
- UV/Vis Spectrophotometer
oTHER Characterization EQUIPMENT
- Rigaku Ultima III X-ray Diffractometer with Small Angle X-ray Scattering (SAXS)
- Mars 230/60 Microwave system
- Micromeritics ASAP 2020 Accelerated Surface Area & Porosimetry System
- Micromeritics AccuPyc 1330 Gas Pycnometer
- Shimadzu LCMS-8050 Triple Quadrupole LC-MS
- Tantec Model CAM-MICRO Contact Angle Meter
- Gamry Instruments Reference 600 Potentiostat
Instruments to support analyses, such as sputter coater, critical point dryer, ultramicrotome, precision saw, polisher and fluorescent microscopes are also available.